Christoph Metzke, M.Sc.

  • Mikro- und Nanoelektronik
  • Struktur- und Oberflächenanalytik
  • FEM-Simulationen

Wissenschaftlicher Mitarbeiter


Zeitschriftenartikel
  • Christoph Metzke
  • Fabian Kühnel
  • Jonas Weber
  • Günther Benstetter
Scanning Thermal Microscopy of Ultrathin Films: Numerical Studies Regarding Cantilever Displacement, Thermal Contact Areas, Heat Fluxes, and Heat Distribution, vol. 11, pg. 491.

In: Nanomaterials

  • 2021

DOI: 10.3390/nano11020491

New micro- and nanoscale devices require electrically isolating materials with specific thermal properties. One option to characterize these thermal properties is the atomic force microscopy (AFM)-based scanning thermal microscopy (SThM) technique. It enables qualitative mapping of local thermal conductivities of ultrathin films. To fully understand and correctly interpret the results of practical SThM measurements, it is essential to have detailed knowledge about the heat transfer process between the probe and the sample. However, little can be found in the literature so far. Therefore, this work focuses on theoretical SThM studies of ultrathin films with anisotropic thermal properties such as hexagonal boron nitride (h-BN) and compares the results with a bulk silicon (Si) sample. Energy fluxes from the probe to the sample between 0.6 µW and 126.8 µW are found for different cases with a tip radius of approximately 300 nm. A present thermal interface resistance (TIR) between bulk Si and ultrathin h-BN on top can fully suppress a further heat penetration. The time until heat propagation within the sample is stationary is found to be below 1 µs, which may justify higher tip velocities in practical SThM investigations of up to 20 µms−1. It is also demonstrated that there is almost no influence of convection and radiation, whereas a possible TIR between probe and sample must be considered.
  • Elektrotechnik und Medientechnik
  • NACHHALTIG
Vortrag
  • Fabian Kühnel
  • Christoph Metzke
  • Günther Benstetter
Thermal conductivity measurements of thin films using 3ω method

In: 7. Tag der Forschung

  • 2020
  • IQMA
  • Elektrotechnik und Medientechnik
  • NACHHALTIG
Zeitschriftenartikel
  • Christoph Metzke
  • Werner Frammelsberger
  • Jonas Weber
  • Fabian Kühnel
  • K. Zhu
  • M. Lanza
  • Günther Benstetter
On the Limits of Scanning Thermal Microscopy of Ultrathin Films, vol. 13, pg. 518.

In: Materials

  • 2020

DOI: 10.3390/ma13030518

Heat transfer processes in micro- and nanoscale devices have become more and more important during the last decades. Scanning thermal microscopy (SThM) is an atomic force microscopy (AFM) based method for analyzing local thermal conductivities of layers with thicknesses in the range of several nm to µm. In this work, we investigate ultrathin films of hexagonal boron nitride (h-BN), copper iodide in zincblende structure (γ-CuI) and some test sample structures fabricated of silicon (Si) and silicon dioxide (SiO2) using SThM. Specifically, we analyze and discuss the influence of the sample topography, the touching angle between probe tip and sample, and the probe tip temperature on the acquired results. In essence, our findings indicate that SThM measurements include artefacts that are not associated with the thermal properties of the film under investigation. We discuss possible ways of influence, as well as the magnitudes involved. Furthermore, we suggest necessary measuring conditions that make qualitative SThM measurements of ultrathin films of h-BN with thicknesses at or below 23 nm possible.
  • Elektrotechnik und Medientechnik
  • IQMA
  • NACHHALTIG
Vortrag
  • Günther Benstetter
  • Christoph Metzke
  • Jonas Weber
Recent Trends in Characterization of Nanoelectronic Materials and Devices with Scanning Probe Microscopy. Invited Talk

In: NanoScientific Symposium China - Scanning Probe Microscopy (SPM)

  • 2020
  • Elektrotechnik und Medientechnik
  • NACHHALTIG
Vortrag
  • Christoph Metzke
  • Fabian Kühnel
  • Günther Benstetter
Thermal characterization of thin films using FEM simulations

In: 7. Tag der Forschung

  • 2020
  • IQMA
  • Elektrotechnik und Medientechnik
  • NACHHALTIG
Vortrag
  • Christoph Metzke
  • Günther Benstetter
  • Werner Frammelsberger
  • Jonas Weber
  • Fabian Kühnel
Temperature dependent investigation of hexagonal boron nitride films using scanning thermal microscopy. Poster presentation

In: 6th Nano Today Conference 2019

  • 2019
  • Elektrotechnik und Medientechnik
  • IQMA
  • NACHHALTIG
Beitrag (Sammelband oder Tagungsband)
  • Christoph Metzke
  • Günther Benstetter
Thermische Charakterisierung ultradünner Schichten, pg. 138-141.
  • 2019
  • Elektrotechnik und Medientechnik
  • IQMA
  • NACHHALTIG
Vortrag
  • Christoph Metzke
  • W. Lehermeier
  • Günther Benstetter
  • Werner Frammelsberger
Evaluation of Topography effects of SThM Measurements on Thin Thermoelectric Films. Poster

In: 4th Ed. Smart Materials and Surfaces - SMS Conference 2018

  • 2018
  • Elektrotechnik und Medientechnik
  • IQMA
  • NACHHALTIG
Vortrag
  • W. Lehermeier
  • Christoph Metzke
Investigation of Local Thermal Properties of Carbon Fiber / Epoxy Composites by using Scanning Thermal Microscopy

In: Applied Research Conference (ARC) 2018

  • 2018
  • IQMA
  • Elektrotechnik und Medientechnik
  • NACHHALTIG
Beitrag (Sammelband oder Tagungsband)
  • Christoph Metzke
  • W. Lehermeier
Investigation of Soft Polymer Surfaces using Atomic Force Microscopy and Laser Scanning Microscopy
  • 2018
  • Elektrotechnik und Medientechnik
  • IQMA
  • NACHHALTIG
Vortrag
  • Christoph Metzke
  • W. Lehermeier
Investigation of Soft Polymer Surfaces using Atomic Force Microscopy and Laser Scanning Microscopy

In: Applied Research Conference (ARC) 2018

  • 2018
  • Elektrotechnik und Medientechnik
  • IQMA
  • NACHHALTIG
Vortrag
  • Günther Benstetter
  • Christoph Metzke
  • W. Lehermeier
Advances in Electrical and Thermal Characterization of Surfaces and Thin Films. Invited Talk

In: 4th Ed. Smart Materials and Surfaces - SMS Conference 2018

  • 2018
  • IQMA
  • Elektrotechnik und Medientechnik
  • NACHHALTIG
Beitrag (Sammelband oder Tagungsband)
  • W. Lehermeier
  • Christoph Metzke
Investigation of Local Thermal Properties of Carbon Fiber / Epoxy Composites by using Scanning Thermal Microscopy
  • 2018
  • IQMA
  • Elektrotechnik und Medientechnik
  • NACHHALTIG