Laboringenieur
Laboringenieur Mess- und Fertigungstechnik Optik
Montag - Donnerstag / Technologiecampus Teisnach T119 / 07:00 - 16:00 Freitag / Technologiecampus Teisnach T119 / 07:00 - 11:30
Impact analysis of temperature and humidity effects on polishing
In: EPJ Web of Conferences vol. 255 pg. 03011.
DOI: 10.1051/epjconf/202125503011
Interferometric measurement with robot kinematics
pg. 114870I.
San Diego, United States
DOI: 10.1117/12.2568348
First steps towards an automated polishing process chain using one robot
pg. 114780I.
Bellingham, WA, USA
DOI: 10.1117/12.2564840
Concept of a two-part clamping system for lenses in optical metrology
pg. 114780G.
Bellingham, WA, USA
DOI: 10.1117/12.2566547
Zero-point clamping systems in optical production
pg. 111710J1-111710J10.
Bellingham, WA, USA
DOI: 10.1117/12.2528774
CGH-Based Interferometer Measurements of Round Robin Asphere
In: 10th High Level Expert Meeting (HLEM) Asphere Metrology on Joint Investigations
Physikalisch-Technische Bundesanstalt Braunschweig
Mid-spatial frequency errors in feed direction occurring in ADAPT polishing
pg. 111710G1-111710G8.
Bellingham, WA, USA
DOI: 10.1117/12.2528114
Interlaboratory comparison measurements of aspheres
In: Measurement Science and Technology vol. 29 pg. 055010.
ABC-polishing
pg. 1082906.
DOI: 10.1117/12.2318549
Contribution of the phase transfer function of extended measurement cavities to mid spatial frequencies and the overall error budget
pg. 108290L.
DOI: 10.1117/12.2318711
DefGO
pg. 108290I.
DOI: 10.1117/12.2318704
Model based error separation of power spectral density artefacts in wavefront measurement
pg. 107490T.
DOI: 10.1117/12.2321106
Model based error separation of power spectral density artefacts in wavefront measurement
In: SPIE Optical Engineering + Applications Conference on Interferometry XIX
San Diego, CA, USA
Contribution of the phase transfer function of extended measurement cavities to mid spatial frequencies and the overall error budget
In: Fifth European Seminar on Precision Optics Manufacturing
Teisnach
Cheap and fast measuring roughness on big surfaces with an imprint method
pg. 1044822.
Deflectometric acquisition of large optical surfaces (DaOS) using a new physical measurement principle: vignetting field stop procedure
DOI: 10.1117/12.2236134
Interferometric measurement of highly accurate flat surfaces
DOI: 10.1117/12.2235525
Deflectometric Acquisition of Large Optical Surfaces “DaOS” Using a New Physical Measurement Principle: Vignetting Field Stop . (Reprinted from Proceedings of SPIE Volume 10009: Third European Seminar on Precision Optics Manufacturing, 100090Y [Teisnach, April 12th 2016] doi:10.1117/12.2236134)
In: Bavarian Journal of Applied Sciences pg. 146-161.
Surface reconstruction by using Zernike polynomials
DOI: 10.1117/12.2236305
The vignetting field stop procedure: A new physical measurement principle for the Deflectometric acquisition of big Optical Surfaces - DaOS
HLEM Round Robin Asphere Test 2015 at the Deggendorf Institute of Technology
In: 7th High Level Expert Meeting 2015 - Asphere Metrology On Joint Investigations
Technische Hochschule Deggendorf/Technologie Campus Teisnach Teisnach
Process developement fort the reproducible roughness measurement of optical surfaces using white light interferometry
In: International Journal of Metrology and Quality Engineering (EDP Sciences) vol. 5 pg. 29-35.
Shape and roughness in white light interferometric measurement
In: 1st European Seminar on Precision Optics Manufacturing
Technische Hochschule Deggendorf/Technologie Campus Teisnach Teisnach
Automatische Kratzererkennung an hochpräzisen Drehteilen . „Projekt KonoScan“
In: SENSOR + TEST
Nürnberg
Generation and field testing of roughness reference samples for industrial testing of surface roughness levels below 0.5nm Sq
pg. 216-218.
Approach to the measurement of astronomical mirrors with new procedures
Messportal TC Teisnach
In: 6. Optikseminar - Agenda zur modernen Optikfertigung
Technische Hochschule Deggendorf/Technologie Campus Teisnach Teisnach
GF-Projekt Optasens - Combination and evaluation of different optical and tactile sensor and measuring methods for analysis and global form-measurement on optical surfaces . Posterpräsentation
In: F.O.M.-Marktplatz der Forschungsprojekte
Berlin
Dreistrahllaserinterferometrie zur Topographievermessung ebener Flächen
In: Photonik - Fachzeitschrift für die optischen Technologien vol. 4 pg. 38-40.
Hochgenaue Optische Abstandssensoren in Messtechnik und Qualitätssicherung
In: 1. Optence Messtechnik Symposium
Darmstadt
Metrology at Technologie Campus Teisnach
In: 8th Workshop Asphere Metrology
Physikalisch-Technische Bundesanstalt (PTB)/Kompetenzzentrum Ultrapräzise Oberflächenbearbeitung e.V. Braunschweig